Controlling item exposure and test overlap in computerized adaptive testing

Applied Psychological Measurement

Volumn 29, Issue 3, 2005, Pages 204-217

  Chen, Shu Ying ^a   Lei, Pui Wa ^b  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Average between test overlap; Computerized adaptive testing; Item exposure control; Item exposure rate; Test overlap rate; Test security

Indexed keywords

EID: 18144390586     PISSN: 01466216     EISSN: None     Source Type: Journal    
DOI: 10.1177/0146621604271495     Document Type: Article

References (12)

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