Correlation metric for generalized feature extraction

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 30, Issue 12, 2008, Pages 2229-2235

  Fu, Yun ^a   Yan, Shuicheng ^b   Huang, Thomas S ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Correlation embedding analysis; Correlational principal component analysis; Face recognition; Feature extraction; Graph embedding

Indexed keywords

CONFORMAL MAPPING; CORRELATION METHODS; FACE RECOGNITION; FEATURE EXTRACTION; GRAPH THEORY;

CORRELATION EMBEDDING ANALYSIS; CORRELATIONAL PRINCIPAL COMPONENT ANALYSIS; DATA DISTRIBUTED; DATA PRE-PROCESSING; DISCRIMINATING POWERS; EUCLIDEAN DISTANCES; GRAPH EMBEDDING; MAPPING DATUMS; NORMALIZED DATUMS; PRINCIPAL COMPONENTS; VISUAL CLASSIFICATIONS;

PRINCIPAL COMPONENT ANALYSIS;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; COMPUTER ASSISTED DIAGNOSIS; FACE; HISTOLOGY; IMAGE ENHANCEMENT; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICS;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; FACE; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; STATISTICS AS TOPIC;

EID: 56549092400     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2008.154     Document Type: Article

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