Depth profiling of cells and tissues by using C 60 + and SF 5 + as sputter ions

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 926-928

  Malmberg, Per ^a   Kriegeskotte, Christian ^c   Arlinghaus, Heinrich F ^c   Hagenhoff, Birgit ^b   Holmgren, Jan ^a   Nilsson, Mikael ^a   Nygren, Håkan ^a  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b TASCON GMBH   (Germany)

^c UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Bi 3 +; C 60 +; Cells; Depth profiling; SF 5 +; Tissues

Indexed keywords

CELL CULTURE; CELLS; CHOLESTEROL; HISTOLOGY; IMAGE ANALYSIS; ION SOURCES; MAMMALS; SPUTTERING; TISSUE;

BI3^+; C60^+; CONSECUTIVE ANALYSIS; INTESTINAL EPITHELIUM; ORGANIC MATERIALS; SF5^+; SINGLE CELL CULTURES; SUPERFICIAL LAYERS;

DEPTH PROFILING;

EID: 56449123257     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.071     Document Type: Article

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