ToF-SIMS study of growth behavior in all-nanoparticle multilayer films using a novel indicator layer

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 977-980

  Chen, Bo Jung ^a   Yin, Yu Sheng ^a   Ling, Yong Chien ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Growth; Multilayer films; Nanoparticle; ToF SIMS; Zeta potential

Indexed keywords

ALUMINA; ALUMINUM OXIDE; DEPOSITION; ELECTROSTATICS; GROWTH (MATERIALS); MULTILAYERS; NANOPARTICLES; ORGANIC POLYMERS; SECONDARY ION MASS SPECTROMETRY; SILICA; TITANIUM DIOXIDE; ZETA POTENTIAL;

CHEMICAL AND PHYSICAL PROPERTIES; ELECTROSTATIC CHARGES; INTERMEDIATE PRODUCT; NANOPARTICLE MULTILAYERS; SURFACE CHEMICAL COMPOSITION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; ZETA POTENTIAL MEASUREMENTS;

MULTILAYER FILMS;

EID: 56449114179     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.036     Document Type: Article

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