Overall circuit loss design method for integrated power converter

2006 4th International Conference on Integrated Power Systems, CIPS 2006

Volumn , Issue , 2006, Pages

  Takao, Kazuto ^a   Irokawa, Hirofumi ^a   Hayashi, Yusuke ^a   Ohashi, Hiromichi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; MOSFET DEVICES; RECONFIGURABLE HARDWARE; SCHOTTKY BARRIER DIODES; SILICON CARBIDE;

CIRCUIT PARAMETER; CONVERTER CIRCUITS; DESIGN METHOD; DEVICE PARAMETERS; DEVICE SIMULATORS; INTEGRATED POWER; REAL CIRCUITS; STRAY INDUCTANCES;

POWER CONVERTERS;

EID: 56449106603     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. H. Ohashi, "Recent Power Devices Trend," IEEJ, vol. 102, No. 3, pp. 168-171, (2002) (in Japanese).
2. Y. Hayashi, K. Takao, K. Adachi and H. Ohashi, "Design Consideration for High Output Power Density (OPD) Converter Based on Power-loss Limit Analysis Method," EPE2005, Dresden Germany, September. 11-14, (2005)
3. Y. Xiao, H. Shah, T. P. Chow, R. J. Gutmann, "Analytical Modeling and Experimental Evaluation of Interconnect Parasitic Inductance on MOSFET Switching Characteristics", IEEE Applied Power Electronics Conference and Exposition (2004)
4. Z. Liang, B. Lu, J. D. Van Wyk and F. C. Lee, "Integrated CoolMOS FET/SiC-Diode Module for High Performance Power Switching", IEEE Trans. Power Electron., vol. 20, no. 3, pp. 679-686 (2005)
5. K. Takao, K. Adachi, Y. Hayashi and H. Ohashi, "Novel power loss limit analysis method for high-speed, ultra-low loss power converter," IEEE 36th Annual Power Electronics Specialists Conference, Brazil Recife, Jun. 12-16, pp. 2201-2207 (2005).
6. K. Takao, K. Adachi, Y. Hayashi and H. Ohashi, "Marginal Power Loss Extraction Method for Future High Output Power Density Converter," lEEJ Trans. lA, Vol., No., (2006), in press
7. B. J. Baliga, "Power Semiconductor devices," PWS publishing company, pp 388-395, 1995.