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Volumn 255, Issue 4, 2008, Pages 1123-1125
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Behcet brain tissue identified with increased levels of Si and Al
c
Derer's Hospital
*
(Slovakia)
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Author keywords
Al; Behcet disease; Brain tissue; Si; TOF SIMS; Trace heavy elements
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Indexed keywords
ALUMINUM;
BRAIN;
DISEASE CONTROL;
HISTOLOGY;
PHOSPHOLIPIDS;
SECONDARY ION MASS SPECTROMETRY;
SILICON;
TRACE ELEMENTS;
BEHCET DISEASE;
BRAIN TISSUE;
CHEMICAL CHARACTERIZATION;
CHEMICAL COMPOSITIONS;
QUALITATIVE DIFFERENCES;
TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;
TOF SIMS;
TRACE HEAVY ELEMENTS;
TISSUE;
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EID: 56449090364
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.05.034 Document Type: Article |
Times cited : (5)
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References (19)
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