X-ray fluorescence and ion beam analysis of iridescent Art Nouveau glass - Authenticity and technology

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 226, Issue 1-2, 2004, Pages 119-125

  Jembrih Simburger D ^a   Neelmeijer, C ^b   Mader M ^b   Schreiner, M ^a  

^a Akademie der Bildenden Kunste Wien   (Austria)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Art Nouveau glass; Ion beam analysis; Iridescent layers; Loetz; Tiffany; X ray fluorescence analysis

Indexed keywords

DATA REDUCTION; DIFFRACTION; FLUORESCENCE; ION BEAMS; NONDESTRUCTIVE EXAMINATION; SCANNING ELECTRON MICROSCOPY; SILICA; STRUCTURE (COMPOSITION); TIN; WEATHERING; X RAY ANALYSIS;

ART NOUVEAU GLASS; ION BEAM ANALYSIS; IRIDESCENT LAYERS; LOETZ; TIFFANY; X-RAY FLUORESCENCE ANALYSIS;

GLASS;

EID: 5644262717     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.03.075     Document Type: Conference Paper

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