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Volumn 133, Issue 1-4, 2000, Pages 151-157
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Identification and classification of iridescent glass artifacts with XRF and SEM/EDX
a,b,c a,b c c d
d
NONE
(Austria)
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Author keywords
Art Nouveau; Clustering; Energy dispersive X ray fluorescence analysis (EDXRF); Energy dispersive X ray microanalysis; Factor analysis; Iridescent glass; Jack Ink; Loetz; Scanning electron microscopy (SEM EDX); Strini Art Glass; Tiffany
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Indexed keywords
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EID: 23544465838
PISSN: 00263672
EISSN: None
Source Type: Journal
DOI: 10.1007/s006040070085 Document Type: Article |
Times cited : (17)
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References (12)
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