메뉴 건너뛰기




Volumn 133, Issue 1-4, 2000, Pages 151-157

Identification and classification of iridescent glass artifacts with XRF and SEM/EDX

Author keywords

Art Nouveau; Clustering; Energy dispersive X ray fluorescence analysis (EDXRF); Energy dispersive X ray microanalysis; Factor analysis; Iridescent glass; Jack Ink; Loetz; Scanning electron microscopy (SEM EDX); Strini Art Glass; Tiffany

Indexed keywords


EID: 23544465838     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040070085     Document Type: Article
Times cited : (17)

References (12)
  • 4
    • 24944514825 scopus 로고
    • The Technology of Tiffany Glass, Application of Science in Examination Works of Art
    • P. A. England, L. van Zelst (Eds.) Museum of Fine Arts, Boston
    • W. D. Kingery, P. V. Vandivier. The Technology of Tiffany Glass, Application of Science in Examination Works of Art, Proceedings of the Seminar. In: P. A. England, L. van Zelst (Eds.) Museum of Fine Arts, Boston, 1983.
    • (1983) Proceedings of the Seminar
    • Kingery, W.D.1    Vandivier, P.V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.