Low-OH all-silica fiber with broadband transparency and radiation resistance in the UV-region

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5317, Issue , 2004, Pages 62-69

  Khalilov, Valery Kh ^b   Klein, Karl Friedrich ^a   Nelson, Gary ^b  

^a TECHNISCHE HOCHSCHULE MITTELHESSEN   (Germany)

^b Polymicro Technolgies LLC   (United States)

Author keywords

Basic attenuation; Silica fibers; UV defects; UV measurement technique; UV stability

Indexed keywords

BASIC ATTENTUATION; RADIATION RESISTANCE; SILICA FIBERS; UV-DEFECTS; UV-STABILITY;

ABSORPTION; ATTENUATION; BROADBAND NETWORKS; FLUORESCENCE; HYDROGEN; RAMAN SCATTERING; RAYLEIGH SCATTERING; SILICA; TRANSPARENCY; ULTRAVIOLET RADIATION;

OPTICAL FIBERS;

EID: 5644254582     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540732     Document Type: Conference Paper

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