메뉴 건너뛰기




Volumn 39, Issue 31, 2000, Pages 5778-5784

Transient absorption in excimer-exposed silica

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; PHOTOLYSIS; RAMAN SCATTERING; SILICA;

EID: 0001641188     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.005778     Document Type: Article
Times cited : (34)

References (15)
  • 1
    • 0001203398 scopus 로고
    • Radiation effects in glass
    • M. Tomozawa and R. H. Doremus, eds. (Academic, New York
    • E. J. Frieble and D. L. Griscom, “Radiation effects in glass,” in Treatise on Material Science and Technology, M. Tomozawa and R. H. Doremus, eds. (Academic, New York, 1979), pp. 257-357.
    • (1979) Treatise on Material Science and Technology , pp. 257-357
    • Frieble, E.J.1    Griscom, D.L.2
  • 2
    • 0002853246 scopus 로고
    • Radiation effects
    • D. R. Uhlmann and J. J. Kreidl, eds. (American Ceramic Society, Cincinnati, Ohio
    • E. J. Frieble, “Radiation effects,” in Optical Properties of Glass, D. R. Uhlmann and J. J. Kreidl, eds. (American Ceramic Society, Cincinnati, Ohio, 1991), pp. 205-214.
    • (1991) Optical Properties of Glass , pp. 205-214
    • Frieble, E.J.1
  • 3
    • 0014796641 scopus 로고
    • Mechanism of color center destruction in hydrogen impregnated radiation resistant glasses
    • S. Faile and D. M. Roy, “Mechanism of color center destruction in hydrogen impregnated radiation resistant glasses,” Mater. Res. Bull. 5, 385-390 (1970).
    • (1970) Mater. Res. Bull. , vol.5 , pp. 385-390
    • Faile, S.1    Roy, D.M.2
  • 4
    • 0000997877 scopus 로고
    • Effects of excimer laser irradiation on the transmission, index of refraction, and density of ultraviolet grade fused silica
    • M. Rothschild, D. J. Ehrlich, and D. C. Shaver “Effects of excimer laser irradiation on the transmission, index of refraction, and density of ultraviolet grade fused silica,” Appl. Phys. Lett. 55, 1276-1278 (1989).
    • (1989) Appl. Phys. Lett , vol.55 , pp. 1276-1278
    • Rothschild, M.1    Ehrlich, D.J.2    Shaver, D.C.3
  • 5
    • 0001694095 scopus 로고
    • Mechanism of intrinsic Si E' center photogeneration in high purity silica
    • T. E. Tsai, D. L. Griscom, and E. J. Frieble, “Mechanism of intrinsic Si E' center photogeneration in high purity silica,” Phys. Rev. Lett. 61, 444-446 (1988).
    • (1988) Phys. Rev. Lett. , vol.61 , pp. 444-446
    • Tsai, T.E.1    Griscom, D.L.2    Frieble, E.J.3
  • 6
    • 0001554268 scopus 로고
    • ArF-excimer-laser-induced emission and absorption bands in fused silica synthesized in reducing conditions
    • N. Kuzuu, Y. Komatsu, and M. Murahara, “ArF-excimer-laser-induced emission and absorption bands in fused silica synthesized in reducing conditions,” Phys. Rev. B 45, 9265-9270 (1991).
    • (1991) Phys. Rev. B , vol.45 , pp. 9265-9270
    • Kuzuu, N.1    Komatsu, Y.2    Murahara, M.3
  • 7
    • 0003181011 scopus 로고
    • ArF-excimer-laser-induced emission and absorption bands in fused silica synthesized under oxidizing conditions
    • N. Kuzuu, Y. Komatsu, and M. Murahara, “ArF-excimer-laser-induced emission and absorption bands in fused silica synthesized under oxidizing conditions,” Phys. Rev. B 45, 2050-2055 (1992).
    • (1992) Phys. Rev. B , vol.45 , pp. 2050-2055
    • Kuzuu, N.1    Komatsu, Y.2    Murahara, M.3
  • 8
    • 0001623531 scopus 로고    scopus 로고
    • Correlation between the radiation-induced intrinsic 4.8 eV optical absorption and 1.9 eV photoluminescence bands in glass SiO2
    • 2,” J. Appl. Phys. 80, 3518-3525 (1996).
    • (1996) J. Appl. Phys. , vol.80 , pp. 3518-3525
    • Skuja, L.1    Tanimura, K.2    Itoh, N.3
  • 12
    • 0001827906 scopus 로고    scopus 로고
    • Induced absorption in silica (A preliminary model)
    • A. J. Marker, ed., Proc. SPIE
    • R. J. Araujo, N. F. Borrelli, and C. Smith, “Induced absorption in silica (a preliminary model),” in Inorganic Optical Materials, A. J. Marker, ed., Proc. SPIE 3424, 2-9 (1998).
    • (1998) Inorganic Optical Materials , vol.3424 , pp. 2-9
    • Araujo, R.J.1    Borrelli, N.F.2    Smith, C.3
  • 13
    • 0001920082 scopus 로고
    • Determining the content of hydrogen dissolved in quartz glass using the methods of Raman scattering and mass spectrometry
    • V. S. Khotimchenko, G. M. Sochivkin, I. I. Novak, and K. N. Kuksenko, “Determining the content of hydrogen dissolved in quartz glass using the methods of Raman scattering and mass spectrometry,” Zh. Prikl. Spektrosk. 46, 987-991 (1987).
    • (1987) Zh. Prikl. Spektrosk. , vol.46 , pp. 987-991
    • Khotimchenko, V.S.1    Sochivkin, G.M.2    Novak, I.I.3    Kuksenko, K.N.4
  • 14
    • 0001656222 scopus 로고
    • Dependence of defects induced by excimer laser on intrinsic structural defects in synthetic silica glasses
    • H. Imai, K. Arai, H. Hosono, Y. Abe, and H. Imagawa “Dependence of defects induced by excimer laser on intrinsic structural defects in synthetic silica glasses,” Phys. Rev. B 44, 4812-4821 (1991).
    • (1991) Phys. Rev. B , vol.44 , pp. 4812-4821
    • Imai, H.1    Arai, K.2    Hosono, H.3    Abe, Y.4    Imagawa, H.5
  • 15
    • 36749121315 scopus 로고    scopus 로고
    • The radiation induced formation of hydrogen and deuterium compounds in silica as observed by Raman scattering
    • C. Hartwig, “The radiation induced formation of hydrogen and deuterium compounds in silica as observed by Raman scattering,” J. Chem. Phys. 66, 227-238 (1997).
    • (1997) J. Chem. Phys. , vol.66 , pp. 227-238
    • Hartwig, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.