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Volumn 226, Issue 1-2, 2004, Pages 163-171
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Non-destructive analysis of coins using high-energy PIXE
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Author keywords
[No Author keywords available]
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Indexed keywords
AGGLOMERATION;
COPPER;
CORROSION;
FLUORESCENCE;
NONDESTRUCTIVE EXAMINATION;
PAINTING;
PROTON BEAMS;
SAMPLING;
SURFACE PHENOMENA;
X RAY ANALYSIS;
ARCHAELOGICAL OBJECTS;
PARCHMENTS;
PROTON INDUCED X-RAY EMISSION (PIXE);
X-RAY FLUORESCENCE (XRF);
COINAGE;
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EID: 5644242060
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.03.015 Document Type: Conference Paper |
Times cited : (20)
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References (19)
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