High-energy PIXE using 68 MeV protons

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 150, Issue 1-4, 1999, Pages 118-123

  Denker, A ^a   Maier, K H ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; HIGH ENERGY PHYSICS; ION BEAMS; NONDESTRUCTIVE EXAMINATION; ONCOLOGY; PROTONS;

HIGH ENERGY PARTICLE INDUCED X RAY EMISSION; ION BEAM ANALYSIS;

X RAY ANALYSIS;

EID: 0033515210     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00922-7     Document Type: Article

References (3)

1. Paul H., Sacher J. At. Data and Nucl. Data Tables. 42:1989;106.
2. Pineda C.A., Peisach M. Nucl. Instr. and Meth. A. 299:1990;618.
3. G.A. Bernasconi, QXAS User Manuals, IAEA Laboratories, Seibersdorf, unpublished.