Is surface crystallization in liquid eutectic AuSi surface-induced?

Journal of Physics Condensed Matter

Volumn 20, Issue 35, 2008, Pages

  Halka, V ^a   Streitel, R ^b,c   Freyland, W ^a,d  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b HARVARD UNIVERSITY   (United States)

^c OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; CONCENTRATION (PROCESS); CRYSTALLIZATION; EUTECTICS; NANOCRYSTALLINE ALLOYS; PHASE INTERFACES; PHOTOELECTRON SPECTROSCOPY; SILICON; SILICON ALLOYS; SILICON COMPOUNDS; STOICHIOMETRY;

ATOMIC LAYERS; CRYSTALLINE SURFACES; INTERFACE MODELS; INTERFACIAL LAYERS; LIQUID EUTECTICS; LOW CONCENTRATIONS; SI CONCENTRATIONS; SI SURFACES; SURFACE CRYSTALLIZATIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 56349154939     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/35/355007     Document Type: Article

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