Electron spectroscopy and scanning tunneling microscopy study of quasi-two-dimensional freezing at the liquid/vapor interface of Ga-Bi alloys

Journal of Chemical Physics

Volumn 121, Issue 23, 2004, Pages 12005-12009

  Issanin, A ^a   Turchanin, A ^a   Freyland, W ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BISMUTH ALLOYS; FREEZING; PHASE DIAGRAMS; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SURFACE TREATMENT; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

FLUID INTERFACE; ROOM TEMPERATURE; SURFACE FREEZING;

GALLIUM ALLOYS;

EID: 11044232421     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1814940     Document Type: Article

References (20)

1. S. Dietrich, in Phase Transitions and Critical Phenomena, edited by C. Domb and J. Lebowitz (Academic, London, 1988), Vol. 12; M. Schick, in Liquids at Interfaces, edited by J. Charvolin, J. F. Joanny, and J. Zinn-Justin (Elsevier, New York, 1990).
2. S. Dietrich, in Phase Transitions and Critical Phenomena, edited by C. Domb and J. Lebowitz (Academic, London, 1988), Vol. 12; M. Schick, in Liquids at Interfaces, edited by J. Charvolin, J. F. Joanny, and J. Zinn-Justin (Elsevier, New York, 1990).
3. J. H. Perepezko, C. Galaup, and K. P. Cooper, Mater. Res. Soc. Symp. Proc. 9, 491 (1982).
4. B. Yang, D. Gidalevitz, D. Li, Z. Huang, and S. A. Rice, Proc. Natl. Acad. Sci. U.S.A. 96, 13009 (1999).
5. A. Turchanin, D. Nattland, and W. Freyland, Chem. Phys. Lett. 337, 5 (2001).
6. A. Turchanin, W. Freyland, and D. Nattland, Phys. Chem. Chem. Phys. 4, 647 (2002).
7. W. Freyland, A. H. Ayyad, and I. Mechdiev, J. Phys.: Condens. Matter 15, S151 (2003).
8. A. Turchanin and W. Freyland, Phys. Chem. Chem. Phys. 5, 5285 (2003).
9. B. Predel, Z. Phys. Chem., Neue Folge 24, 206 (1960).
10. B. Predel, Z. Metallkd. 50, 663 (1959).
11. A. Issanin, A. Turchanin, and W. Freyland, Chem. Phys. Lett. 394, 220 (2004).
12. A. Turchanin, R. Tsekov, and W. Freyland, J. Chem. Phys. 120, 11171 (2004).
13. A. H. Ayyad and W. Freyland, Surf. Sci. 506, 1 (2002).
14. H. Tostmann, E. Di Masi, O. G. Shpyrko, P. S. Pershan, B. M. Ocko, and M. Deutsch, Phys. Rev. Lett. 84, 4385 (2000).
15. D. Briggs and M. P. Seah, Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy, 2nd ed. (Wiley, New York, 1990), Vol. 1.
16. C. J. Powell and A. Jablonski, NIST Standard Reference Database 71 U.S. Department of Commerce, 2000).
17. A. H. Ayyad, I. Mechdiev, and W. Freyland, Chem. Phys. Lett. 259, 326 (2002).
18. A. Issanin, Ph.D. thesis, Universität Karlsruhe, 2005.
19. V. S. Edelmann, D. Yu. Sharvin, I. N. Khlyustikov, and A. M. Troyanovskii, Europhys. Lett. 34, 115 (1996).
20. R. Tsekov and W. Freyland, J. Phys.: Condens. Matter 15, 6155 (2003).