TID and SEE response of advanced 4G NAND flash memories

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2008, Pages 31-37

  Qldham, T R ^a   Suhail, M ^b   Friendlich, M R ^c   Carts, M A ^c   Ladbury, R L ^a   Kim, H S ^c   Berg, M P ^c   Poivey, C ^d   Sanders, A B ^a   Seidleck, C M ^c   LaBel, K A ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

^c MEI Technologies   (United States)

^d EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC RADIATION; FLASH MEMORY; IONIZING RADIATION; NAND CIRCUITS; OCEANOGRAPHY; RADIATION; SEA LEVEL; SECONDARY EMISSION; TECHNICAL PRESENTATIONS; WATER LEVELS;

ATMOSPHERIC NEUTRONS; FIGURE OF MERITS; NAND FLASH MEMORIES; TOTAL DOSES;

RADIATION EFFECTS;

EID: 56349151516     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2008.12     Document Type: Conference Paper

References (6)

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2. E.L. Petersen, The SEU figure of merit and proton upset calculations, IEEE Trans. Nucl. Sci., vol. NS-45, no. 6, pp. 2550-2565 (1998).
3. T.R. Oldham, M. Friendlich, J.W. Howard, M.D. Berg, H.S. Kim, T.L. Irwin, and K.A. LaBel, TID and SEE response of an advanced Samsing flash memory, IEEE Radiation Effects Data Workshop Record (2007).
4. E. Normand, Extensions of the FOM method-proton SEL and atmospheric neutron SEU, IEEE Trans. Nucl. Sci., vol. NS-51, no. 6, pp. 3494-3504 (2004).
5. J.F. Ziegler and H. Puchner, SER-history, trends and challenges, Cypress Press, 2004.
6. E.L. Petersen, private communication.