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Volumn , Issue , 2008, Pages 5-10

Compendium of recent total ionizing dose results for candidate spacecraft electronics for NASA

Author keywords

Total Ionizing Dose

Indexed keywords

DIGITAL DEVICES; IONIZING RADIATION; NASA; RADIATION; SPACECRAFT; TECHNICAL PRESENTATIONS;

EID: 56349143468     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2008.9     Document Type: Conference Paper
Times cited : (15)

References (5)
  • 1
    • 56349168995 scopus 로고    scopus 로고
    • M. O'Bryan, et al., Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA submitted to the 2008 IEEE NSREC Radiation Effects Data Workshop.
    • M. O'Bryan, et al., Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA" submitted to the 2008 IEEE NSREC Radiation Effects Data Workshop.
  • 2
    • 56349123367 scopus 로고    scopus 로고
    • Department of Defense Test Method sTANDARD Microcircuits, MIL-STD-883 Test Method 1019.7 Ionizing radiation (total dose) test procedure, September 30, 2006, http:/www.dscc.dla.mil/downloads/MIL-STD-883/std883.pdf
    • Department of Defense "Test Method sTANDARD Microcircuits," MIL-STD-883 Test Method 1019.7 Ionizing radiation (total dose) test procedure, September 30, 2006, http:/www.dscc.dla.mil/downloads/MIL-STD-883/std883.pdf
  • 5
    • 56349084675 scopus 로고    scopus 로고
    • Heavy-ion test of Virtex 4 FPGA XC4VFX60 from Xilinx
    • Test Report, June
    • "Heavy-ion test of Virtex 4 FPGA XC4VFX60 from Xilinx," Test Report, June 2007.
    • (2007)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.