Large-scale patterning of indium tin oxide electrodes for guided mode extraction from organic light-emitting diodes

Journal of Applied Physics

Volumn 104, Issue 9, 2008, Pages

  Geyer, Ulf ^a   Hauss, Julian ^a   Riedel, Boris ^a   Gleiss, Sebastian ^a   Lemmer, Uli ^a   Gerken, Martina ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRODES; ETCHING; GUIDED ELECTROMAGNETIC WAVE PROPAGATION; HELMET MOUNTED DISPLAYS; INDIUM; LIGHT EMISSION; LIGHT EMITTING DIODES; MICROCOMPUTERS; PHOTOLITHOGRAPHY; PHOTONIC CRYSTALS; PHOTONICS; PLASMA DIAGNOSTICS; PLASMA ETCHING; TIN; TITANIUM COMPOUNDS;

ELECTRODE LAYERS; EMISSION ANGLES; GUIDED MODES; INDIUM TIN OXIDES; LASER INTERFERENCE LITHOGRAPHIES; LIGHT EMITTING DIODE LEDS; LIGHT OUTCOUPLING; OPTICAL TRANSMISSION MEASUREMENTS; RESONANT MODES; SCALABLE PRODUCTIONS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 56349112012     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3014034     Document Type: Article

References (19)

1. B. W. D'Andrade and S. R. Forrest, Adv. Mater. (Weinheim, Ger.) 16, 1585 (2004).
2. C. Adachi, M. A. Baldo, M. E. Thompson, and S. R. Forrest, J. Appl. Phys. 90, 5048 (2001).
3. W. L. Barnes, J. Lightwave Technol. 17, 2170 (1999).
4. H. Greiner, Jpn. J. Appl. Phys., Part 1 46, 4125 (2007).
5. J. M. Lupton, B. J. Matterson, I. D. W. Samuel, M. J. Jory, and W. L. Barnes, Appl. Phys. Lett. 77, 3340 (2000).
6. M. Fujita, K. Ishihara, T. Ueno, T. Asano, S. Noda, H. Ohata, T. Tsuji, H. Nakada, and N. Shimoji, Jpn. J. Appl. Phys., Part 1 44, 3669 (2005).
7. Y.-J. Lee, S.-H. Kim, J. Huh, G.-H. Kim, Y.-H. Lee, S.-H. Cho, Y.-C. Kim, and Y. R. Do, Appl. Phys. Lett. 82, 3779 (2003).
8. M. Kitamura, S. Iwamoto, and Y. Arakawa, Jpn. J. Appl. Phys., Part 1 44, 2844 (2005).
9. Y.-C. Kim, S.-H. Cho, Y.-W. Song, Y.-J. Lee, Y.-H. Lee, and Y. R. Do, Appl. Phys. Lett. 89, 173502 (2006).
10. A. Adawi, R. Kullock, J. Turner, C. Vasilev, D. Lidzey, A. Tahraoui, P. Fry, D. Gibson, E. Smith, C. Foden, M. Roberts, F. Qureshi, and N. Athanassopoulou, Org. Electron. 7, 222 (2006).
11. K. Ishihara, M. Fujita, I. Matsubara, T. Asano, S. Noda, H. Ohata, A. Hirasawa, H. Nakada, and N. Shimoji, Appl. Phys. Lett. 90, 111114 (2007).
12. A. Gombert, B. Bläsi, C. Bühler, P. Nitz, J. Mick, W. HoΒfeld, and M. Niggemann, Opt. Eng. (Bellingham) 43, 2525 (2004).
13. D.-S. Leem, J. Cho, C. Sone, Y. Park, and T.-Y. Seong, J. Appl. Phys. 98, 076107 (2005).
14. H.-G. Hong, S.-S. Kim, D.-Y. Kim, T. Lee, J.-O. Song, J. H. Cho, C. Sone, Y. Park, and T.-Y. Seong, Appl. Phys. Lett. 88, 103505 (2006).
15. S. J. Chang, C. F. Shen, W. S. Chen, C. T. Kuo, T. K. Ko, S. C. Shei, and J. K. Sheu, Appl. Phys. Lett. 91, 013504 (2007).
16. R. A. Gottscho, C. W. Jurgensen, and D. J. Vitkavage, J. Vac. Sci. Technol. B 10, 2133 (1992).
17. Y. Nazirizadeh, J. Müller, U. Geyer, D. Schelle, E. Kley, A. Tünnermann, U. Lemmer, and M. Gerken, Opt. Express 16, 7153 (2008).
18. T. Fuhrmann, K. Samse, J. Salbeck, A. Perschke, and H. Franke, Org. Electron. 4, 219 (2003).
19. N. Danz, D. Michaelis, and C. Wächter, Proc. SPIE 6475, 64750J (2007).