The application of carbon nanotube electron sources to the electron microscope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7037, Issue , 2008, Pages

  Mann, Mark ^a   El Gomati, Mohamed ^b   Wells, Torquil ^b   Milne, William I ^a   Teo, Ken B K ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF YORK   (United Kingdom)

Author keywords

Carbon nanotube; CNT; Electron gun; Electron microscope; Electron source; Tungsten tip

Indexed keywords

CARBON; ELECTRON BEAMS; ELECTRON GUNS; ELECTRON MICROSCOPES; ELECTRON SOURCES; ELECTRON TUBES; ELECTRONS; ELEMENTARY PARTICLE SOURCES; FIELD EMISSION; MICROSCOPES; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PLASMA STABILITY; TUNGSTEN;

CHEMICAL VAPOUR DEPOSITIONS; CNT; CURRENT STABILITIES; FIELD EMISSION PROPERTIES; FIELD EMITTERS; HIGH RESOLUTIONS; LOW VOLTAGES; MASS PRODUCTIONS; MEAN CURRENTS; NEW PROCESSES; OPTICAL-; SCHOTTKY; TUNGSTEN TIP;

CARBON NANOTUBES;

EID: 56249146030     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.797289     Document Type: Conference Paper

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