|
Volumn 310, Issue 23, 2008, Pages 4772-4775
|
Growth of InAs on Si substrates at low temperatures using metalorganic vapor phase epitaxy
|
Author keywords
A3. Metalorganic vapor phase epitaxy; B1. InAs; B1. Silicon; B2. Semiconducting III V materials
|
Indexed keywords
ANNEALING;
CRYSTAL GROWTH;
EPITAXIAL GROWTH;
FILM GROWTH;
HIGH RESOLUTION ELECTRON MICROSCOPY;
INDIUM ARSENIDE;
LATTICE MISMATCH;
METALLORGANIC VAPOR PHASE EPITAXY;
MICROSCOPIC EXAMINATION;
SEMICONDUCTING INDIUM;
SEMICONDUCTOR GROWTH;
SILICON;
SINGLE CRYSTALS;
SUBSTRATES;
VAPORS;
A3. METALORGANIC VAPOR PHASE EPITAXY;
ATOMIC FORCES;
B1. INAS;
B1. SILICON;
B2. SEMICONDUCTING III-V MATERIALS;
DEVICE APPLICATIONS;
GROWTH BEHAVIORS;
HIGH RESOLUTIONS;
ISLAND FORMATIONS;
LARGE LATTICE MISMATCHES;
LOW TEMPERATURES;
METAL ORGANIC;
MOVPE GROWTHS;
RAPID NUCLEATIONS;
SI SUBSTRATES;
SUBSEQUENT ANNEALING;
SURFACE MOBILITIES;
THIN LAYERS;
TRIMETHYL INDIUMS;
V/III RATIOS;
X-RAY DIFFRACTIONS;
SEMICONDUCTING SILICON COMPOUNDS;
|
EID: 56249133501
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2008.07.048 Document Type: Article |
Times cited : (15)
|
References (23)
|