Some considerations for precision metrology of thin x-ray mirrors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7018, Issue , 2008, Pages

  Lehan, J P ^a,e   Saha, T ^a   Zhang, W W ^a   Owens Rohrbach, S ^a   Chan, K W ^a,e   Hadjimichael, T ^a,b   Hong, M ^a,c   Davis, W ^d  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Ball Aerospace   (United States)

^c SGT INC   (United States)

^d HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

^e UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

Author keywords

Constellation X; Mirror mounting; Optomechanics; X ray telescopes

Indexed keywords

INSTRUMENTS; MOUNTINGS; OPTICAL INSTRUMENTS; OPTICAL TELESCOPES; PHOTOGRAPHY; TELESCOPES;

CONSTELLATION-X; GLASS MIRRORS; OPTOMECHANICS; PRECISION METROLOGIES; STATIC DEFORMATIONS; X-RAY TELESCOPES;

MIRRORS;

EID: 56249119582     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.789798     Document Type: Conference Paper

References (8)

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