Optical metrology for the segmented optics on the Constellation-X soft X-ray telescope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5168, Issue , 2004, Pages 207-218

  Content, David ^a   Colella, David ^a   Fleetwood, Charles ^b   Hadjimichael, Theo ^b   Saha, Timo ^a   Wright, Geraldine ^a   Zhang, William ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

Constellation X; Optical Metrology; X ray optics

Indexed keywords

ASTRONOMY; GLASS; INTERFEROMETRY; LASER APPLICATIONS; OPTICAL TELESCOPES; OPTICAL VARIABLES MEASUREMENT; SENSORS; X RAY SCATTERING;

CONSTELLATION-X; OPTICAL METROLOGY;

X RAY OPTICS;

EID: 1842739577     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.508144     Document Type: Conference Paper

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