High capacitance carbon-based xerogel film produced without critical drying

Applied Physics Letters

Volumn 93, Issue 19, 2008, Pages

  Tao, Yousheng ^a   Endo, Morinobu ^a   Ohsawa, Risa ^b   Kanoh, Hirofumi ^b   Kaneko, Katsumi ^b  

^a SHINSHU UNIVERSITY   (Japan)

^b CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COLLOIDS; CURING; CYCLIC VOLTAMMETRY; DATA STORAGE EQUIPMENT; DEWATERING; ELECTRIC CHARGE; ELECTRIC CONDUCTIVITY; EMISSION SPECTROSCOPY; FIELD EMISSION; FREE VOLUME; GRAVIMETRIC ANALYSIS; MICROSCOPIC EXAMINATION; THERMOGRAVIMETRIC ANALYSIS; XEROGELS;

ADSORPTION/DESORPTION; CRACK FREE; CRITICAL DRYING; ELECTRICAL CHARGES; ELECTRICAL CONDUCTIVITIES; ELECTRICAL ENERGIES; EXCELLENT PERFORMANCES; FIELD EMISSION SCANNING ELECTRON MICROSCOPIES; HIGH SURFACE AREAS; POTENTIAL APPLICATIONS; SUPERCRITICAL DRYING; UNIT VOLUMES; VOLTAMMETRY MEASUREMENTS; XEROGEL FILMS;

ELECTRIC NETWORK ANALYSIS;

EID: 56249109401     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976684     Document Type: Article

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