Thin-film filters for a high resolution miniaturized spectrometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7101, Issue , 2008, Pages

  Piegari, Angela ^a   Sytchkova, Anna K ^a   Bulir, Jiri ^a,b   Harnisch, Bernd ^c   Wuttig, Andreas ^d  

^a ENEA   (Italy)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c EUROPEAN SPACE AGENCY   (Netherlands)

^d LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

Optical coatings; Spectrometers; Variable filters

Indexed keywords

AIR FILTERS; COATINGS; FUSED SILICA; OPTICAL COATINGS; OPTICAL FILTERS; OPTICAL MATERIALS; SILICA; SPECTROMETERS; SPECTROMETRY; THICK FILMS; THIN FILM DEVICES; THIN FILMS; WAVE FILTERS;

BAND-PASS FILTERS; EDGE FILTERS; FABRICATION TECHNOLOGIES; FILTER PERFORMANCES; FILTER SURFACES; FILTER TRANSMISSIONS; FUSED SILICA SUBSTRATES; GRADED COATINGS; HIGH RESOLUTIONS; R.F. SPUTTERING; SELECTION TECHNIQUES; SPATIAL PROFILES; SPATIAL VARIATIONS; SPECTRAL RANGES; THROUGH TRANSMISSIONS; TRANSMISSION FILTERS; TRANSMISSION PEAKS; VARIABLE FILTERS;

OPTICAL FILMS;

EID: 56249108089     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.797286     Document Type: Conference Paper

References (5)

1. A. Piegari, J. Bulir, "Variable narrow-band transmission filters with wide rejection band for spectrometry", Appl. Opt., 45, 16, 3768-3773 (2006)
2. D. Morelli, Interference Filter Handbook, (OCLI-JDSU, California, 2006), 195-200 www.ocli.com
3. A.Piegari, J.Bulir, A.Krasilnikova Sytchkova, "Variable transmission filters for spectrometry from Space 2. Fabrication process", Appl. Opt. 47, C121-126 (2008)
4. A. Wuttig, R. Riesenberg, G. Nitzsche, "Subpixel analysis of a double array grating spectrometer", SPIE Proc. "Imaging Spectrometry VII", 4480, 334-344 (2002)
5. A.Krasilnikova Sytchkova, A. Piegari, M.Dami, L.Abel, F.Lemarquis, M. Lequime, "Spatially resolved spectroscopy for non-uniform thin film coatings: comparison of two dedicated set-up", SPIE Proc."Optical Fabrication, Testing and Metrology", 5965, 573-580 (2005)