Spatially resolved spectroscopy for non-uniform thin film coatings: Comparision of two dedicated set-ups

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5965, Issue , 2005, Pages

  Krasilnikova, A ^a   Piegari, A ^a   Dami, M ^b   Abel Tiberini, L ^c   Lemarquis, F ^c   Lequime, M ^c  

^a ENEA   (Italy)

^b GALILEO AVIONICA   (Italy)

^c AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Non uniform thin film; Spatially resolved measurement; Spectroscopy

Indexed keywords

CHARGE COUPLED DEVICES; LIGHT MEASUREMENT; OPTICAL RESOLVING POWER; SPECTROPHOTOMETERS; THIN FILMS;

NON-UNIFORM THIN FILM; OPTICAL PERFORMANCE; SINGLE LAYER COATING; SPATIALLY RESOLVED MEASUREMENT;

OPTICAL COATINGS;

EID: 33244466980     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.625183     Document Type: Conference Paper

References (2)

1. D. Morelli, Interference Filter Handbook, (OCLI, California, 1998), www.ocli.com
2. L. Abel-Tiberini, F.Lemarquis and M.Lequime, "Dedicated spectrophotometer for localized transmittance and reflectance measurements", to be published in Applied Optics 2005