Measurement of pump-induced transient lensing in a cryogenically-cooled high average power Ti:sapphire amplifier

Optics Express

Volumn 16, Issue 23, 2008, Pages 18557-18564

  Planchon, Thomas A ^a   Amir, Wafa ^a   Childress, Colby ^a   Squier, Jeff A ^a   Durfee, Charles G ^a  

^a Department of Geology and Geological Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE SHIFT;

HIGH AVERAGE POWER; MEASUREMENTS OF; MULTIPASS AMPLIFIERS; REPETITION RATE; SPATIALLY RESOLVED; SPECTRAL INTERFEROMETRY; THERMAL COMPONENT; THERMAL LENSING;

SAPPHIRE;

AMPLIFIER; ARTICLE; COLD; ENERGY TRANSFER; EQUIPMENT; EQUIPMENT DESIGN; LASER; OPTICAL INSTRUMENTATION; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

AMPLIFIERS, ELECTRONIC; COLD TEMPERATURE; ENERGY TRANSFER; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LASERS; LENSES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 56149098711     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.018557     Document Type: Article

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