Simultaneous visualization of spatial and chromatic aberrations by two-dimensional Fourier transform spectral interferometry

Optics Letters

Volumn 31, Issue 19, 2006, Pages 2927-2929

  Amir, W ^a   Planchon, T A ^a   Durfee, C G ^a   Squier, J A ^a   Gabolde, P ^b   Trebino, R ^b   Muller M ^c  

^a Department of Geology and Geological Engineering   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; FOURIER ANALYSIS; IMAGE ENHANCEMENT; INTERFEROMETRY; METHODOLOGY; MULTIPHOTON MICROSCOPY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; VALIDATION STUDY;

ALGORITHMS; ARTIFACTS; FOURIER ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INTERFEROMETRY; MICROSCOPY, FLUORESCENCE, MULTIPHOTON; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS;

NUMERICAL-APERTURE OBJECTIVES; SPATIOTEMPORAL EFFECTS; SPECTRAL INTERFEROMETRY; SPHERICAL ABERRATIONS;

ABERRATIONS; INTERFEROMETRY; MICROSCOPIC EXAMINATION; PHOTONS; SPECTRUM ANALYSIS;

FOURIER TRANSFORMS;

EID: 33750191400     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.31.002927     Document Type: Article

References (14)

1. J. A. Squier and M. Müller, Rev. Sci. Instrum. 72, 28-55 (2001).
2. M. Kempe and W. Rudolph, Phys. Rev. A 48, 4721 (1993).
3. C. J. R. Sheppard and T. Wilson, Appl. Opt. 18, 1058 (1979).
4. M. Kempe, U. Stamm, B. Wilelml, and W. Rudolph, J. Opt. Soc. Am. B 9, 11-58 (1992).
5. Z. Bor, Opt. Lett. 14, 119 (1989).
6. Z. Bor, J. Mol. Spectrosc. 35, 1907 (1988).
7. Z. Bor and R. L. Horvath, Opt. Commun. 94, 249.
8. M. Kempe and W. Rudolph, Opt. Lett. 18, 137 (1993).
9. J. Jasapara and W. Rudolph, Opt. Lett. 24, 777 (1999).
10. L. Lepetit, G. Chériaux, and M. Joffre, J. Opt. Soc. Am. B 12, 24-67 (1995).
11. C. Iaconis and I. A. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
12. R. Trebino and D. J. Kane, J. Opt. Soc. Am. A 10, 1101.
13. C. Dorrer, E. M. Kosik, and I. A. Walmsley, Opt. Lett. 27, 548 (2002).
14. T. A. Planchon, S. Ferré, G. Hamoniaux, G. Cheriaux, and J.-P. Chambaret, Opt. Lett. 29, 2300 (2004).