Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stress

IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Volumn , Issue , 2007, Pages 134-137

  Huang, Shih Che ^a   Tsao, Hung Chuan ^a   Tai, Ya Hsiang ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EXHIBITIONS; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICON; THIN FILM TRANSISTORS;

AC STRESSES; CHANNEL LENGTHS; CHANNEL SHORTENINGS; MOS FETS; UNDER GATES; V CURVES;

CHANNEL ESTIMATION;

EID: 56049094369     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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2. Uraoka, Y; Hirai, N.; Yano, H.; Hatayama, T.; Fuyuki, T. "Hot carrier analysis in low-temperature poly-Si thin-film transistors using pico-second time-resolved emission microscope," IEEE Electron Device Letters, v 24, n 4, April, 2003, p 236-238
3. Shih-Che Huang, Yu-Han Kao, Ya-Hsiang Tai, "Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysis," Thin Solid Films, 515 (2006) 1206-1209
4. Y. Uraoka, H. Yano, T. Hatayama and T. Fuyuki, "Hot Carrier Effect in Low-Temperature poly-Si p-ch Thin-Film Transistors under Dynamic Stress," Jpn. J. Appl. Phys. Vol. 41 (2002) pp. L 13-L 16 Part 2, No. 1A/B, 15 January 2002
5. Kook Chul Moon, Jae-Hoon Lee, Moon-Young Shin and Min-Koo Han, "Observation of electron trapping in p-type polycrystalline silicon thin film transistors due to hot carrier stress employing C-V measurement," proceedings of AMLCD '03, pp. 181-184
6. Koyanagi, Mitsumasa ; Lewis, Alan G.; Martin, Russel A.; Huang, Tiao-Yuan; Chen, John Y., "Hot-Electron-lnduced Punchthrough (HEIP) Effect In Submicrometer PMOSFET's," IEEE Transactions on Electron Devices, v ED-34, n 4, Apr, 1987, p 839-844