Broadband electrical characterization of macroporous silicon at microwave frequencies

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 11, 2008, Pages 2548-2551

  Contopanagos, H ^a   Pagonis, D N ^a   Nassiopoulou, A G ^a  

^a INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIZATION; AVERAGE DIAMETERS; COMPLEX PERMITTIVITIES; CYLINDRICAL PORES; DIRECT MEASUREMENTS; DOPED SI; ELECTRICAL CHARACTERIZATIONS; ELECTROMAGNETIC SOLVERS; ETHANOL SOLUTIONS; FIRST HARMONICS; GEOMETRICAL CHARACTERISTICS; GHZ FREQUENCIES; MACROPOROUS SILICONS; MEASUREMENT SETS; MICROSTRIP; ON CHIPS; PASSIVE DEVICES; POROUS SILICON LAYERS; RANDOMLY DISTRIBUTED; RF ISOLATIONS; SILICON SUBSTRATES; SYSTEM USING; TRANSMISSION LINES;

CURVE FITTING; ELECTROMAGNETIC WAVES; ETHANOL; FREQUENCY BANDS; MICROWAVE FREQUENCIES; MICROWAVES; NONMETALS; PERMITTIVITY; SCATTERING PARAMETERS; SILICON; SUBSTRATES;

POROUS SILICON;

EID: 55849125394     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200780105     Document Type: Conference Paper

References (5)

1. H. S. Kim, K. Chong, and Y. H. Xie, phys. stat. sol. (a) 197(1) 269 (2003).
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3. A. Halimaoui, in: Properties of Porous Silicon, edited by L. Canham, EMIS Data Rev. Ser. No. 18 (INSPEC publication, 1997), p. 12.
4. L. Lehman, phys. stat. sol. (a) 197(1), 13 (2003).
5. R. Tena-Zaera, S. Bastide, and C. Levy-Clement, phys. stat. sol. (a) 204(5), 1260 (2007).