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Volumn 203, Issue 5-7, 2008, Pages 638-642
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The effects of the post annealing temperatures of (Pb0.92La0.08)(Zr0.65Ti0.35)O3 (PLZT) thin films on ITO coated glass
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Author keywords
Ferroelectric; PLZT; Thin films
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Indexed keywords
ANNEALING;
ELECTROMAGNETIC WAVES;
FERROELECTRIC FILMS;
GLASS;
HYSTERESIS;
HYSTERESIS LOOPS;
LANTHANUM;
LEAD;
MAGNETIC MATERIALS;
MAGNETRON SPUTTERING;
POLARIZATION;
RAPID THERMAL ANNEALING;
RAPID THERMAL PROCESSING;
SOLIDS;
THICK FILMS;
THIN FILMS;
TIN;
TITANIUM COMPOUNDS;
ZIRCONIUM;
ANNEALING TEMPERATURES;
ATOMIC FORCE MICROSCOPES;
COATED GLASS SUBSTRATES;
COATED GLASSES;
COERCIVE FIELDS;
FATIGUE PROPERTIES;
FERROELECTRIC;
LEAD ZIRCONATE TITANATE THIN FILMS;
PLZT;
PLZT THIN FILMS;
R.F. MAGNETRON SPUTTERING;
REMNANT POLARIZATIONS;
SQUARE WAVES;
SWITCHING CYCLES;
SWITCHING POLARIZATIONS;
X-RAY DIFFRACTIONS;
OXIDE FILMS;
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EID: 55749094660
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2008.05.059 Document Type: Article |
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Times cited : (4)
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References (11)
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