Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion

International Journal of Solids and Structures

Volumn 46, Issue 2, 2009, Pages 322-330

  Liang, Xinghua ^a   Wang, Biao ^a   Liu, Yulan ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

Eigenstrain; Ellipsoidal inclusion; Half space; Stress field; Thickness; Thin film

Indexed keywords

FOURIER TRANSFORMS; SOLIDS; STRESSES; THICK FILMS; THIN FILM DEVICES; THIN FILMS;

EIGENSTRAIN; ELLIPSOIDAL INCLUSION; HALF-SPACE; STRESS FIELD; THICKNESS;

INCLUSIONS;

EID: 55649104103     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijsolstr.2008.08.039     Document Type: Article

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