A general solution for two-dimensional stress distributions in thin films

Journal of Applied Mechanics, Transactions ASME

Volumn 71, Issue 5, 2004, Pages 691-696

  Krlshnamurthy, R ^a   Srolovitz, D J ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT INCORPORATION; FILM-SUBSTRATE INTERFACE; STRESS-FREE STRAINS; THIN FILM GROWTH;

BOUNDARY CONDITIONS; FOURIER TRANSFORMS; FUNCTIONS; MATHEMATICAL MODELS; STRAIN; STRESS CONCENTRATION; THERMOELASTICITY;

THIN FILMS;

EID: 12344285167     PISSN: 00218936     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1782649     Document Type: Article

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