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Volumn 80, Issue 21, 2008, Pages 7957-7963

Capacitive and solution resistance effects on voltammetric responses of a thin redox layer attached to disk microelectrodes

(3) Amatore, Christian a Oleinick, Alexander a,b Svir, Irina a,b

a ECOLE NORMALE SUPÉRIEURE (France)

b KHARKIV NATIONAL UNIVERSITY OF RADIO ELECTRONICS (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; MICROELECTRODES;

CAPACITANCE EFFECT; CURRENT COMPONENT; ELECTRODE CAPACITANCE; HIGH VOLTAGE; QUANTITATIVE EVALUATION; SOLUTION RESISTANCE; VOLTAMMETRIC RESPONSE; VOLTAMMOGRAMS;

CAPACITANCE;

ARTICLE; CYCLIC POTENTIOMETRY; ELECTRIC CAPACITANCE; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; MICROELECTRODE; OXIDATION REDUCTION REACTION; QUANTITATIVE ANALYSIS; SIMULATION; STEADY STATE; THEORETICAL MODEL;

EID: 55549142999 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac8012972 Document Type: Article

Times cited : (11)

References (11)

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