Ohmic drop compensation in cyclic voltammetry at scan rates in the megavolt per second range: Access to nanometric diffusion layers via transient electrochemistry

Journal of Electroanalytical Chemistry

Volumn 486, Issue 2, 2000, Pages 141-155

  Amatore, Christian ^a   Maisonhaute, Emmanuel ^a   Simonneau, Gérard ^a  

^a Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; EQUIVALENT CIRCUITS; ULTRAFAST PHENOMENA;

OHMIC DROP; POTENTIOSTATS;

CYCLIC VOLTAMMETRY;

EID: 0033723207     PISSN: 00220728     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(00)00131-5     Document Type: Article

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