Variable-angle directional emissometer for moderate-temperature emissivity measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7065, Issue , 2008, Pages

  Ellis, A R ^a   Graham, H M ^b   Sinclair, Michael B ^a   Verley, J C ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b LOCKHEED MARTIN   (United States)

Author keywords

Emissivity; Emissometer; Reflectivity; Thermal emission

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC WAVE EMISSION; LIGHT; PROCESS ENGINEERING; REFLECTION;

ANGLES OF INCIDENCES; BACKGROUND NOISES; BACKSCATTERED LIGHTS; DATA ANALYSIS METHODS; EMISSIVITY; EMISSOMETER; MEASUREMENT PROCESSES; REFLECTIVITY; REFLECTIVITY MEASUREMENTS; SYSTEM DESIGNS; THERMAL EMISSION; THERMAL EMISSIONS; TRANSMISSIVITY;

ELECTROMAGNETIC WAVES;

EID: 55549140148     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.796507     Document Type: Conference Paper

References (5)

1. C. H. Seager, M.B. Sinclair, J. G. Fleming, "Accurate measurements of thermal radiation from a tungsten photonic lattice", Applied Physics Letters 86, 244105 (2005)
2. D. B. Chase, "The Sensitivity and Limitations of Condensed Phase Infrared Emission Spectroscopy", Applied Spectroscopy 35, 77-81 (1981)
3. J. T. Neu, M. T. Beecroft, R. Schramm, "Extended Performance Infrared Directional Reflectometer for the Measurement of Total, Diffuse and Specular Reflectance," Proceedings of SPIE 2260, 62-73 (1994)
4. H. M. Graham, H. G. Carter, "Correction for Angular Spread in HDR Determination of IR Optical Constants", Proceedings of SPIE 5192, 80-90 (2003)
5. S. A. Kemme, A. A. Cruz-Cabrera, D. W. Peters, A. R. Ellis, R. D. Briggs, T. R. Carter, S. Samora, "Managing Thermal Emission: Plasmon/Photon Coupling Using Diffractive Optics Technology", Proceedings of SPIE 6975, 697502 (2008)