Continuous time-of-flight ion imaging: Application to fragmentation

Analytical Chemistry

Volumn 80, Issue 21, 2008, Pages 8299-8307

  Yoon, Oh Kyu ^a   Robbins, Matthew D ^a   Zuleta, Ignacio A ^a   Barbula, Griffin K ^a   Zare, Richard N ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACQUISITION TIMES; BEAM MODULATIONS; CHROMATOGRAPHIC SEPARATIONS; CONTINUOUS TIMES; DUTY CYCLES; FLIGHT TIMES; INDUCED DISSOCIATIONS; MASS SPECTRUMS; MULTICHANNEL PLATES; PEAK HEIGHTS; POSTSOURCE DECAYS; PSEUDO RANDOMS; REFLECTRON; TIME OF FLIGHTS;

ELECTROLYSIS; ION BOMBARDMENT; IONIC STRENGTH; LIQUID CHROMATOGRAPHY; MASS SPECTROMETERS; MASS SPECTROMETRY; MODULATION; NEGATIVE IONS; THREE DIMENSIONAL; TWO DIMENSIONAL;

IONS;

ION;

ARTICLE; CHROMATOGRAPHY; CONTINUOUS PROCESS; FRAGMENTATION REACTION; FREQUENCY MODULATION; KINETICS; MASS SPECTROMETRY; MOLECULAR IMAGING; SEPARATION TECHNIQUE; THREE DIMENSIONAL IMAGING; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 55549115337     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac801512n     Document Type: Article

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