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Volumn 16, Issue 7, 2005, Pages 1117-1130

Peak height precision in Hadamard transform time-of-flight mass spectra

Author keywords

[No Author keywords available]

Indexed keywords

HADAMARD TRANSFORM; SIGNAL INTENSITY; SPECTRAL NOISE; TIME-OF-FLIGHT MASS SPECTROMETRY (TOFMS);

EID: 20444478731     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jasms.2005.02.022     Document Type: Article
Times cited : (19)

References (18)
  • 1
    • 0542397745 scopus 로고    scopus 로고
    • Hadamard Transform Time-of-Flight Mass Spectrometry
    • A. Brock, N. Rodriguez, R.N. Zare Hadamard Transform Time-of-Flight Mass Spectrometry Anal. Chem. 70 1998 3735 3741
    • (1998) Anal. Chem. , vol.70 , pp. 3735-3741
    • Brock, A.1    Rodriguez, N.2    Zare, R.N.3
  • 2
    • 0037414950 scopus 로고    scopus 로고
    • High-Speed Mass Spectrometry Hadamard Transform Time-of-Flight Mass Spectrometry: More Signal, More of the Time
    • R.N. Zare, F.M. Fernandez, J.R. Kimmel High-Speed Mass Spectrometry Hadamard Transform Time-of-Flight Mass Spectrometry More Signal, More of the Time Angew. Chem. Int. Ed. 42 2003 30 35
    • (2003) Angew. Chem. Int. Ed. , vol.42 , pp. 30-35
    • Zare, R.N.1    Fernandez, F.M.2    Kimmel, J.R.3
  • 4
    • 0038038533 scopus 로고    scopus 로고
    • Effects of Modulation Defects on Hadamard Transform Time-of-flight Mass Spectrometry (HT-TOFMS)
    • J.R. Kimmel, F.M. Fernandez, R.N. Zare Effects of Modulation Defects on Hadamard Transform Time-of-flight Mass Spectrometry (HT-TOFMS) J. Am. Soc. Mass. Spectrom. 14 2003 278 286
    • (2003) J. Am. Soc. Mass. Spectrom. , vol.14 , pp. 278-286
    • Kimmel, J.R.1    Fernandez, F.M.2    Zare, R.N.3
  • 5
    • 0035669382 scopus 로고    scopus 로고
    • Novel Method for the Production of Finely Spaced Bradbury-Nielson Gates
    • J.R. Kimmel, F. Engelke, R.N. Zare Novel Method for the Production of Finely Spaced Bradbury-Nielson Gates Rev. Sci. Instrum. 72 2001 4354 4357
    • (2001) Rev. Sci. Instrum. , vol.72 , pp. 4354-4357
    • Kimmel, J.R.1    Engelke, F.2    Zare, R.N.3
  • 7
    • 0016881334 scopus 로고
    • Optical Image Processing by Multiplex Coding
    • C.J. Oliver Optical Image Processing by Multiplex Coding Appl. Opt. 15 1976 93 106
    • (1976) Appl. Opt. , vol.15 , pp. 93-106
    • Oliver, C.J.1
  • 8
    • 0011133031 scopus 로고
    • Selective Multiplex Advantage with an Electro-optic Hadamard Transform Spectrometer for Multielemental Atomic Emission
    • D.C. Tilotta, R.C. Fry, W.G. Fateley Selective Multiplex Advantage with an Electro-optic Hadamard Transform Spectrometer for Multielemental Atomic Emission Talanta 37 1990 53 60
    • (1990) Talanta , vol.37 , pp. 53-60
    • Tilotta, D.C.1    Fry, R.C.2    Fateley, W.G.3
  • 9
    • 0038198324 scopus 로고
    • Theoretical Multiplex Gain in a UV/VIS Hadamard Transform Spectrometer Utilizing a Uniformly Imperfect Encoding Mask
    • D.C. Tilotta Theoretical Multiplex Gain in a UV/VIS Hadamard Transform Spectrometer Utilizing a Uniformly Imperfect Encoding Mask Talanta 37 1990 61 69
    • (1990) Talanta , vol.37 , pp. 61-69
    • Tilotta, D.C.1
  • 10
    • 0016129940 scopus 로고
    • Theoretical Comparison of Singly Multiplexed Hadamard Transform Spectrometers and Scanning Spectrometers
    • N.M. Larson, R. Crosmun, Y. Talmi Theoretical Comparison of Singly Multiplexed Hadamard Transform Spectrometers and Scanning Spectrometers Appl. Opt. 13 1974 2662 2668
    • (1974) Appl. Opt. , vol.13 , pp. 2662-2668
    • Larson, N.M.1    Crosmun, R.2    Talmi, Y.3
  • 12
    • 18444417146 scopus 로고    scopus 로고
    • A Soft On-Column Metal Coating Procedure for Robust Sheathless Electrospray Emitters Used in Capillary Electrophoresis/Mass Spectrometry
    • O. Trapp, E.W. Pearce, J.R. Kimmel, O.K. Yoon, I.A. Zuleta, R.N. Zare A Soft On-Column Metal Coating Procedure for Robust Sheathless Electrospray Emitters Used in Capillary Electrophoresis/Mass Spectrometry Electrophoresis 26 2005 1358 1365
    • (2005) Electrophoresis , vol.26 , pp. 1358-1365
    • Trapp, O.1    Pearce, E.W.2    Kimmel, J.R.3    Yoon, O.K.4    Zuleta, I.A.5    Zare, R.N.6
  • 14
    • 0034657245 scopus 로고    scopus 로고
    • Theoretical Maximal Precision for Mass-to-Charge Ratio, Amplitude, and Width Measurements in Ion-Counting Mass Analyzers
    • H. Lee, A.G. Marshall Theoretical Maximal Precision for Mass-to-Charge Ratio, Amplitude, and Width Measurements in Ion-Counting Mass Analyzers Anal. Chem. 72 2000 2256 2260
    • (2000) Anal. Chem. , vol.72 , pp. 2256-2260
    • Lee, H.1    Marshall, A.G.2
  • 15
    • 34447113865 scopus 로고
    • A Comparison of Signal-to-Noise Ratios for Single Channel Methods (Sequential and Multiplex) Versus Multichannel Methods in Optical Spectroscopy
    • J.D. Wineforder, R. Avni, T.L. Chester, J.J. Fitzgerald, L.P. Hart, D.J. Johnson, F.W. Plankly A Comparison of Signal-to-Noise Ratios for Single Channel Methods (Sequential and Multiplex) Versus Multichannel Methods in Optical Spectroscopy Spectrochim. Acta 31B 1976 1 19
    • (1976) Spectrochim. Acta , vol.31 , pp. 1-19
    • Wineforder, J.D.1    Avni, R.2    Chester, T.L.3    Fitzgerald, J.J.4    Hart, L.P.5    Johnson, D.J.6    Plankly, F.W.7
  • 18
    • 0034150178 scopus 로고    scopus 로고
    • Orthogonal Acceleration Time-of-Flight Mass Spectrometry
    • M. Guilhaus, D. Selby, V. Mlynski Orthogonal Acceleration Time-of-Flight Mass Spectrometry Mass Spectrom. Rev. 19 2000 65 107
    • (2000) Mass Spectrom. Rev. , vol.19 , pp. 65-107
    • Guilhaus, M.1    Selby, D.2    Mlynski, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.