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Volumn 20, Issue 20, 2008, Pages 2192-2198
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Measurement of nitrogen mustard degradation products by poly(dimethylsiloxane) microchip electrophoresis with contactless conductivity detection
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Author keywords
Contactless conductivity detection; Microchip capillary electrophoresis; Nitrogen mustard gas degradation products; Poly(dimethylsiloxane); Poly(ethyleneimine) coating
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Indexed keywords
ALKALINITY;
CHEMICAL WARFARE;
COST EFFECTIVENESS;
DEGRADATION;
MICROCHANNELS;
MICROPROCESSOR CHIPS;
CONTACTLESS CONDUCTIVITY DETECTION;
DEGRADATION PRODUCTS;
GAS DEGRADATIONS;
MICROCHIP CAPILLARY ELECTROPHORESIS;
MUSTARD GAS;
NITROGEN MUSTARD GAS DEGRADATION PRODUCT;
NITROGEN MUSTARDS;
POLY(DIMETHYLSILOXANE);
POLY(ETHYLENEIMINE);
POLY(ETHYLENEIMINE) COATING;
POLYDIMETHYLSILOXANE(PDMS);
CAPILLARY ELECTROPHORESIS;
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EID: 55449105137
PISSN: 10400397
EISSN: 15214109
Source Type: Journal
DOI: 10.1002/elan.200804320 Document Type: Article |
Times cited : (15)
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References (21)
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