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Volumn 20, Issue 20, 2008, Pages 2192-2198

Measurement of nitrogen mustard degradation products by poly(dimethylsiloxane) microchip electrophoresis with contactless conductivity detection

Author keywords

Contactless conductivity detection; Microchip capillary electrophoresis; Nitrogen mustard gas degradation products; Poly(dimethylsiloxane); Poly(ethyleneimine) coating

Indexed keywords

ALKALINITY; CHEMICAL WARFARE; COST EFFECTIVENESS; DEGRADATION; MICROCHANNELS; MICROPROCESSOR CHIPS;

EID: 55449105137     PISSN: 10400397     EISSN: 15214109     Source Type: Journal    
DOI: 10.1002/elan.200804320     Document Type: Article
Times cited : (15)

References (21)
  • 4
    • 85153212896 scopus 로고    scopus 로고
    • J. A. Fracassi da Silva, C. L. do Lago, Anal. Chem. 1998, 70, 4339.
    • J. A. Fracassi da Silva, C. L. do Lago, Anal. Chem. 1998, 70, 4339.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.