Tricalcium silicate T1 and T2 polymorphic investigations: Rietveld refinement at various temperatures using synchrotron powder diffraction

Journal of the American Ceramic Society

Volumn 87, Issue 9, 2004, Pages 1625-1634

  Peterson, Vanessa K ^a   Hunter, Brett A ^b   Ray, Abhi ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DIFFERENTIAL THERMAL ANALYSIS; HIGH TEMPERATURE EFFECTS; LATTICE CONSTANTS; MATHEMATICAL MODELS; X RAY POWDER DIFFRACTION;

POLYMORPHIC; RIETVELD REFINEMENT; SYNCHROTRON POWDER DIFFRACTION; TRICALCIUM SILICATE; X RAY FLUORESCENCE;

CALCIUM COMPOUNDS;

EID: 5544317568     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2004.01625.x     Document Type: Article

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