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Volumn 32, Issue 9, 2002, Pages 1347-1356

The superstructure of C3S from synchrotron and neutron powder diffraction and its role in quantitative phase analyses

Author keywords

Ca3SiO5; Characterization; Rietveld method; X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; NEUTRON DIFFRACTION; SILICATES; SYNCHROTRON RADIATION; X RAY POWDER DIFFRACTION;

EID: 0036721827     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-8846(02)00796-2     Document Type: Article
Times cited : (200)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.