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Volumn 5273, Issue , 2004, Pages 296-302

Design of a production process to enhance optical performance of 3ω optics

Author keywords

Fused silica; Laser conditioning; Laser damage; Laser mitigation; Surface damage

Indexed keywords

LASER CONDITIONING; LASER MITIGATION; OPTICAL DAMAGE RESISTANCE; SURFACE DAMAGE;

EID: 5544297535     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.523857     Document Type: Conference Paper
Times cited : (17)

References (4)
  • 1
    • 0036035459 scopus 로고    scopus 로고
    • UV laser conditioning for the reduction of 351-nm damage initiation in fused silica
    • Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau and Christopher J. Stolz, eds.
    • Raymond M. Brusasco, Bernie M. Penetrante, John E. Peterson, Stephen M. Maricle, Joseph A. Menapace, "UV laser conditioning for the reduction of 351-nm damage initiation in fused silica," in Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau and Christopher J. Stolz, eds. SPIE Vol. 4679, 48-55 (2002).
    • (2002) SPIE , vol.4679 , pp. 48-55
    • Brusasco, R.M.1    Penetrante, B.M.2    Peterson, J.E.3    Maricle, S.M.4    Menapace, J.A.5
  • 2
    • 0036035458 scopus 로고    scopus 로고
    • 2 laser treatment for mitigation of 351 nm damage growth on fused silica
    • Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau and Christopher J. Stolz, eds.
    • 2 laser treatment for mitigation of 351 nm damage growth on fused silica," in Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau and Christopher J. Stolz, eds. SPIE Vol. 4679, 40-47 (2002).
    • (2002) SPIE , vol.4679 , pp. 40-47
    • Brusasco, R.M.1    Penetrante, B.M.2    Butler, J.A.3    Hrubesh, L.W.4
  • 4
    • 5544242504 scopus 로고    scopus 로고
    • Michael D. Feit and Alexander M. Rubinchek, elsewhere in these proceedings
    • Michael D. Feit and Alexander M. Rubinchek, elsewhere in these proceedings.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.