On the "life" of {113} defects

Materials Research Society Symposium - Proceedings

Volumn 810, Issue , 2004, Pages 103-108

  Cherkashin, N ^a,b   Calvo, P ^a,b   Cristiano, F ^b   De Mauduit, B ^a,b   Claverie, A ^a,b  

^a CEMES CNRS   (France)

^b LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL ANALYSIS; COMPUTER SIMULATION; DIFFUSION; DISSOLUTION; PRECIPITATION (CHEMICAL); SILICON; STATISTICAL METHODS;

DANGLING BONDS; INTERSTITIAL DEFECTS; OSTWALD RIPENING; PRECIPITATES;

IMAGING TECHNIQUES;

EID: 5544281695     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-810-c3.7     Document Type: Conference Paper

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