Physical origins of temperature variation and background radiation associated with pyrometric interferometry measurement during III-V molecular-beam-epitaxy growth

Applied Physics Letters

Volumn 69, Issue 18, 1996, Pages 2683-2685

  Zhou, J J ^a   Li, Y ^a   Thompson, P ^a   Sato, D L ^a   Lee, H P ^a   Kuo, J M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544263261     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117677     Document Type: Article

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