Characterization of impact materials around Barringer Meteor Crater by micro-PIXE and micro-SRXRF techniques

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 219-220, Issue 1-4, 2004, Pages 555-560

  Uzonyi, I ^a   Szoor Gy ^b   Rozsa P ^b   Vekemans, B ^c   Vincze, L ^c   Adams, F ^c   Drakopoulos, M ^d   Somogyi, A ^d   Kiss, Á Z ^a  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^b UNIVERSITY OF DEBRECEN   (Hungary)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Barringer Crater; Impact materials; Micro PIXE; Micro SRXRF; Siderophile elements

Indexed keywords

ATTENUATION; CALIBRATION; COMPOSITION; ELECTROMAGNETIC WAVE EMISSION; GEOLOGY; METEOR IMPACTS; PHOTONS; POLARIZATION; RADIOISOTOPES; SCATTERING; X RAYS;

BARRINGER CRATER; IMPACT MATERIALS; MICRO PROTON-INDUCED X-RAY EMISSION (MICRO-PIXE); SIDEROPHILE ELEMENTS; SYNCHROTRON RADIATION X-RAY FLUORESCENCE (SRXRF);

SYNCHROTRON RADIATION;

EID: 2442438616     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.119     Document Type: Conference Paper

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