Photonic crystal with multiple-hole defect for sensor applications

Optics Express

Volumn 16, Issue 22, 2008, Pages 18188-18193

  Kang, Christopher ^a   Weiss, Sharon M ^a,b  

^a VANDERBILT UNIVERSITY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; NATURAL FREQUENCIES; PHOTONIC CRYSTALS; REFRACTIVE INDEX; RESONANCE; SURFACE DEFECTS; TIME DOMAIN ANALYSIS;

FINITE-DIFFERENCE TIME-DOMAIN CALCULATIONS; MONOLAYER THICKNESS; MULTI-HOLE DEFECTS; QUALITY FACTORS; RESONANCE FREQUENCIES; SENSING APPLICATIONS; SENSOR APPLICATIONS; SUB-WAVELENGTH HOLES;

CRYSTAL DEFECTS;

EID: 55349144518     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.018188     Document Type: Article

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