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Volumn 79, Issue 10, 2008, Pages

Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; CRYSTALS; ELECTROMAGNETIC WAVES; ELECTRON OPTICS; INFRARED SPECTROSCOPY; POWDERS; SPHERES; ULTRAVIOLET RADIATION; X RAY ANALYSIS;

EID: 55349142534     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2965010     Document Type: Conference Paper
Times cited : (12)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.