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Volumn 79, Issue 10, 2008, Pages
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Wide-angle point-to-point x-ray imaging with almost arbitrarily large angles of incidence
a a a a b b b |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLOGRAPHY;
CRYSTALS;
ELECTROMAGNETIC WAVES;
ELECTRON OPTICS;
INFRARED SPECTROSCOPY;
POWDERS;
SPHERES;
ULTRAVIOLET RADIATION;
X RAY ANALYSIS;
ANGLES OF INCIDENCES;
BENT CRYSTALS;
BROAD SPECTRUMS;
ELECTROMAGNETIC RADIATIONS;
EXTREME UV;
IMAGING ERRORS;
SPHERICAL MIRRORS;
VISIBLE LIGHTS;
ULTRASONIC IMAGING;
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EID: 55349142534
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2965010 Document Type: Conference Paper |
Times cited : (12)
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References (9)
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