Application of maximum likelihood estimator in nano-scale optical path length measurement using spectral-domain optical coherence phase microscopy

Optics Express

Volumn 16, Issue 22, 2008, Pages 17186-17195

  Motaghian Nezam, S M R ^a   Joo, C ^a   Tearney, G J ^a   De Boer, J F ^a  

^a MASSACHUSETTS GENERAL HOSPITAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; DISTRIBUTION FUNCTIONS; ENDOTHELIAL CELLS; MAXIMUM LIKELIHOOD; NANOTECHNOLOGY; OPTICAL TOMOGRAPHY; PROBABILITY DENSITY FUNCTION; SIGNAL TO NOISE RATIO; STRAIN MEASUREMENT; TOMOGRAPHY;

COMMON-PATH INTERFEROMETERS; CUMULATIVE DISTRIBUTION FUNCTION; INTERFERENCE SPECTRUM; MAXIMUM LIKELIHOOD ESTIMATOR; MAXIMUM-LIKELIHOOD ESTIMATE; OPTICAL COHERENCE PHASE MICROSCOPY; PROBABILITY DENSITY FUNCTION (PDF); SPECTRAL DOMAIN OPTICAL COHERENCE TOMOGRAPHIES;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 55349124339     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.017186     Document Type: Article

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