Different methods of reconstructing spectra from filtered x-ray diode measurements

Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

  Seifter, Achim ^a   Kyrala, George A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES;

DIODE MEASUREMENTS; EMISSION SPECTRUMS; HOHLRAUM; HOHLRAUMS; OMEGA LASERS; SPECTRAL REGIONS;

EMISSION SPECTROSCOPY;

EID: 55349111871     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2957935     Document Type: Conference Paper

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