SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 104, Issue 8, 2008, Pages

Fast simulation of phase-change processes in chalcogenide alloys using a Gillespie-type cellular automata approach

(3) Ashwin, Peter a Patnaik, B S V b Wright, C David a

a UNIVERSITY OF EXETER (United Kingdom)

b INDIAN INSTITUTE OF TECHNOLOGY MADRAS (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUTOMATA THEORY; CELLULAR AUTOMATA; CRYSTALLIZATION; DATA STORAGE EQUIPMENT; DENSITY FUNCTIONAL THEORY; METALLIC COMPOUNDS; MONOMERS; NANOCRYSTALLINE ALLOYS; PATTERN RECOGNITION SYSTEMS; SURFACE CHEMISTRY; SURFACE TENSION; TRANSLATION (LANGUAGES);

AB INITIO; ANNEALING CYCLES; CHALCOGENIDE ALLOYS; CHANGE PROCESSES; COMPLEX MOLECULES; CRYSTAL SIZE DISTRIBUTIONS; CRYSTALLIZATION BEHAVIORS; FAST SIMULATIONS; FREE ENERGY CHANGES; HIGHER TEMPERATURES; IN PHASE; INCUBATION TIMES; KOLMOGOROV; LENGTH SCALES; LOW TEMPERATURES; MELTING DYNAMICS; MEMORY APPLICATIONS; MODELING METHODS; MOLECULAR LENGTH SCALES; OPTICAL-; SPATIO-TEMPORAL MODELING; STOCHASTIC CELLULAR AUTOMATONS; SURFACE ENERGIES; TEMPORAL VARIATIONS; TIME SCALES;

PHASE CHANGE MEMORY;

EID: 55249111304 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2978334 Document Type: Article

Times cited : (34)

References (18)

1
- 1642327470
- 0018-9383 10.1109/TED.2003.823243.
- A. Pirovano, A. L. Lacaita, A. Benvenuti, F. Pellizzer, and R. Bez, IEEE Trans. Electron Devices 0018-9383 10.1109/TED.2003.823243 51, 452 (2004).
- (2004) IEEE Trans. Electron Devices , vol.51 , pp. 452
- Pirovano, A.¹ Lacaita, A.L.² Benvenuti, A.³ Pellizzer, F.⁴ Bez, R.⁵

2
- 31144432926
- C. D. Wright, M. Armand, and M. M. Aziz, IEEE Trans. Nanotechnol. 5, 50 (2006).
- (2006) IEEE Trans. Nanotechnol. , vol.5 , pp. 50
- Wright, C.D.¹ Armand, M.² Aziz, M.M.³

3
- 0742284414
- 0021-8979 10.1063/1.1633984.
- S. Senkader and C. D. Wright, J. Appl. Phys. 0021-8979 10.1063/1.1633984 95, 504 (2004).
- (2004) J. Appl. Phys. , vol.95 , pp. 504
- Senkader, S.¹ Wright, C.D.²

4
- 0037098062
- E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. Mijiritskii, J. Appl. Phys. 91, 9794 (2002).
- (2002) J. Appl. Phys. , vol.91 , pp. 9794
- Meinders, E.R.¹ Borg, H.J.² Lankhorst, M.H.R.³ Hellmig, J.⁴ Mijiritskii, A.⁵

5
- 27244434946
- 1063-651X 10.1103/PhysRevE.72.011607.
- K. B. Blyuss, P. Ashwin, A. P. Bassom, and C. D. Wright, Phys. Rev. E 1063-651X 10.1103/PhysRevE.72.011607 72, 011607 (2005).
- (2005) Phys. Rev. e , vol.72 , pp. 011607
- Blyuss, K.B.¹ Ashwin, P.² Bassom, A.P.³ Wright, C.D.⁴

6
- 33244486323
- Z. Sun, J. Zhou, and R. Ahuja, Phys. Rev. Lett. 96, 055507 (2006).
- (2006) Phys. Rev. Lett. , vol.96 , pp. 055507
- Sun, Z.¹ Zhou, J.² Ahuja, R.³

7
- 42549141873
- J. Hegedus and S. R. Elliot, Nature Mater. 7, 399 (2008).
- (2008) Nature Mater. , vol.7 , pp. 399
- Hegedus, J.¹ Elliot, S.R.²

8
- 0141904725
- W. Yu, C. D. Wright, S. P. Banks, and E. P. Palmiere, IEEE Proc. Sci. Measure. Tech. 150, 211 (2003).
- (2003) IEEE Proc. Sci. Measure. Tech. , vol.150 , pp. 211
- Yu, W.¹ Wright, C.D.² Banks, S.P.³ Palmiere, E.P.⁴

9
- 34250754425
- 0021-9606 10.1063/1.2745299.
- Y. Cao, D. T. Gillespie, and L. Petzold, J. Chem. Phys. 0021-9606 10.1063/1.2745299 126, 224101 (2007).
- (2007) J. Chem. Phys. , vol.126 , pp. 224101
- Cao, Y.¹ Gillespie, D.T.² Petzold, L.³

10
- 32844461228
- S. Vedantam and B. S. V. Patnaik, Phys. Rev. E 73, 016703 (2006).
- (2006) Phys. Rev. e , vol.73 , pp. 016703
- Vedantam, S.¹ Patnaik, B.S.V.²

11
- 4243457001
- 1063-651X 10.1103/PhysRevE.57.4323.
- A. Karma and W. -J. Rappel, Phys. Rev. E 1063-651X 10.1103/PhysRevE.57. 4323 57, 4323 (1998).
- (1998) Phys. Rev. e , vol.57 , pp. 4323
- Karma, A.¹ Rappel, W.-J.²

12
- 0001299959
- 1063-651X 10.1103/PhysRevE.48.1897.
- G. Caginalp and W. Xie, Phys. Rev. E 1063-651X 10.1103/PhysRevE.48.1897 48, 1897 (1993).
- (1993) Phys. Rev. e , vol.48 , pp. 1897
- Caginalp, G.¹ Xie, W.²

13
- 33645429016
- 0022-3654 10.1021/j100540a008.
- D. T. Gillespie, J. Phys. Chem. 0022-3654 10.1021/j100540a008 81, 2340 (1977).
- (1977) J. Phys. Chem. , vol.81 , pp. 2340
- Gillespie, D.T.¹

14
- 31544439115
- 0021-4922 10.1143/JJAP.44.5943.
- S. S. Kim, S. M. Jeong, K. H. Lee, Y. K. Park, Y. T. Kim, J. T. Kong, and H. L. Lee, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.44.5943 44, 5943 (2005).
- (2005) Jpn. J. Appl. Phys., Part 1 , vol.44 , pp. 5943
- Kim, S.S.¹ Jeong, S.M.² Lee, K.H.³ Park, Y.K.⁴ Kim, Y.T.⁵ Kong, J.T.⁶ Lee, H.L.⁷

15
- 0035868089
- 0021-8979 10.1063/1.1351868.
- V. Weidenhof, I. Friedrich, S. Ziegler, and M. Wuttig, J. Appl. Phys. 0021-8979 10.1063/1.1351868 89, 3168 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 3168
- Weidenhof, V.¹ Friedrich, I.² Ziegler, S.³ Wuttig, M.⁴

16
- 0014846586
- 0039-6028 10.1016/0039-6028(70)90085-3.
- D. Kashchiev, Surf. Sci. 0039-6028 10.1016/0039-6028(70)90085-3 22, 319 (1970).
- (1970) Surf. Sci. , vol.22 , pp. 319
- Kashchiev, D.¹

17
- 5144233821
- 0021-4922 10.1143/JJAP.43.4695.
- S. R. Ovshinsky, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.43.4695 43, 4695 (2004).
- (2004) Jpn. J. Appl. Phys., Part 1 , vol.43 , pp. 4695
- Ovshinsky, S.R.¹

18
- 33846948224
- 0003-6951 10.1063/1.2475606.
- C. D. Wright, P. Ashwin, and K. Blyuss, Appl. Phys. Lett. 0003-6951 10.1063/1.2475606 90, 063113 (2007).
- (2007) Appl. Phys. Lett. , vol.90 , pp. 063113
- Wright, C.D.¹ Ashwin, P.² Blyuss, K.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.