Measurement of optical constants for molten phase-change thin film

Japanese Journal of Applied Physics

Volumn 47, Issue 7 PART 2, 2008, Pages 6039-6041

  Eto, Daisuke ^a   Aoki, Kazuhiko ^a   Ohkubo, Shuichi ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Archival data; Bootstrap; Eyring acceleration test; Life expectancy; Optical disk; Reliability

Indexed keywords

DATA RECORDING; METAL MELTING; METALLIC COMPOUNDS; MICROSCOPIC EXAMINATION; OPTICAL CONSTANTS; OPTICAL RECORDING; OXIDE FILMS; SMELTING; SOLIDS; THERMOCHEMISTRY; THICK FILMS; THIN FILM DEVICES; THIN FILMS;

ARCHIVAL DATA; BOOTSTRAP; EYRING ACCELERATION TEST; LIFE EXPECTANCY; OPTICAL DISK;

MELTING POINT;

EID: 55249110825     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.6039     Document Type: Article

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