Numerical simulations and experiments about contamination mechanism of solid immersion lens system concerning hole and geometries of lens holder

Japanese Journal of Applied Physics

Volumn 47, Issue 7 PART 2, 2008, Pages 5800-5805

  Choi, Moon Ho ^a   Yang, Tae Man ^a   Rhim, Yoon Chul ^a   Seo, Jeong Kyo ^b   Choi, In Ho ^b   Min, Byung Hoon ^b  

^a Yonsei University   (South Korea)

^b LG Electronics Inc   (South Korea)

Author keywords

Back flow; Contamination; Flow bypass; Numerical simulationMicro PIV; Solid immersion lens

Indexed keywords

CONTAMINATION; FLOW VISUALIZATION; LENSES; OPTICAL INSTRUMENTS; OPTICAL WAVEGUIDES;

BACK FLOW; FLOW-BYPASS; NUMERICAL SIMULATIONMICRO-PIV; NUMERICAL SIMULATIONS; PARTICLE IMAGE VELOCIMETRY SYSTEMS; SOLID IMMERSION LENS; SOLID IMMERSION LENSES; STATIC PRESSURES; TOP SURFACES;

OPTICAL DATA STORAGE;

EID: 55249107828     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.5800     Document Type: Article

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